stm-analyzer
Scanning Tunneling Microscopy skill for atomic-resolution imaging and local density of states measurements
Best use case
stm-analyzer is best used when you need a repeatable AI agent workflow instead of a one-off prompt.
Scanning Tunneling Microscopy skill for atomic-resolution imaging and local density of states measurements
Teams using stm-analyzer should expect a more consistent output, faster repeated execution, less prompt rewriting.
When to use this skill
- You want a reusable workflow that can be run more than once with consistent structure.
When not to use this skill
- You only need a quick one-off answer and do not need a reusable workflow.
- You cannot install or maintain the underlying files, dependencies, or repository context.
Installation
Claude Code / Cursor / Codex
Manual Installation
- Download SKILL.md from GitHub
- Place it in
.claude/skills/stm-analyzer/SKILL.mdinside your project - Restart your AI agent — it will auto-discover the skill
How stm-analyzer Compares
| Feature / Agent | stm-analyzer | Standard Approach |
|---|---|---|
| Platform Support | Not specified | Limited / Varies |
| Context Awareness | High | Baseline |
| Installation Complexity | Unknown | N/A |
Frequently Asked Questions
What does this skill do?
Scanning Tunneling Microscopy skill for atomic-resolution imaging and local density of states measurements
Where can I find the source code?
You can find the source code on GitHub using the link provided at the top of the page.
SKILL.md Source
# STM Analyzer
## Purpose
The STM Analyzer skill provides atomic-resolution surface analysis through scanning tunneling microscopy, enabling visualization of atomic structures and measurement of local electronic properties.
## Capabilities
- Atomic-resolution imaging
- STS (Scanning Tunneling Spectroscopy)
- Local density of states mapping
- Surface reconstruction analysis
- Molecular imaging
- Low-temperature operation protocols
## Usage Guidelines
### STM Analysis
1. **Imaging**
- Optimize tunneling parameters
- Apply drift correction
- Identify atomic features
2. **Spectroscopy**
- Acquire dI/dV spectra
- Map electronic states
- Identify band structure features
3. **Data Processing**
- Apply Fourier filtering
- Correct for thermal drift
- Calibrate atomic distances
## Process Integration
- In-Situ Characterization Experiment Design
- Structure-Property Correlation Analysis
## Input Schema
```json
{
"data_file": "string",
"analysis_type": "imaging|spectroscopy|sts_mapping",
"bias_voltage": "number (V)",
"setpoint_current": "number (nA)"
}
```
## Output Schema
```json
{
"imaging": {
"atomic_structure": "string",
"lattice_constant": "number (nm)",
"defects_identified": ["string"]
},
"spectroscopy": {
"band_gap": "number (eV)",
"fermi_level": "number (eV)",
"density_of_states": {"energy": [], "dos": []}
}
}
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