tof-sims-analyzer
Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging
Best use case
tof-sims-analyzer is best used when you need a repeatable AI agent workflow instead of a one-off prompt.
Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging
Teams using tof-sims-analyzer should expect a more consistent output, faster repeated execution, less prompt rewriting.
When to use this skill
- You want a reusable workflow that can be run more than once with consistent structure.
When not to use this skill
- You only need a quick one-off answer and do not need a reusable workflow.
- You cannot install or maintain the underlying files, dependencies, or repository context.
Installation
Claude Code / Cursor / Codex
Manual Installation
- Download SKILL.md from GitHub
- Place it in
.claude/skills/tof-sims-analyzer/SKILL.mdinside your project - Restart your AI agent — it will auto-discover the skill
How tof-sims-analyzer Compares
| Feature / Agent | tof-sims-analyzer | Standard Approach |
|---|---|---|
| Platform Support | Not specified | Limited / Varies |
| Context Awareness | High | Baseline |
| Installation Complexity | Unknown | N/A |
Frequently Asked Questions
What does this skill do?
Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging
Where can I find the source code?
You can find the source code on GitHub using the link provided at the top of the page.
SKILL.md Source
# ToF-SIMS Analyzer
## Purpose
The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.
## Capabilities
- Molecular ion identification
- Surface contamination analysis
- 2D and 3D chemical imaging
- Isotope labeling detection
- Depth profiling
- Principal component analysis of spectra
## Usage Guidelines
### ToF-SIMS Analysis
1. **Spectral Analysis**
- Identify characteristic fragments
- Build peak lists for materials
- Apply multivariate analysis
2. **Imaging Mode**
- Optimize spatial resolution
- Generate chemical maps
- Correlate with topography
3. **Depth Profiling**
- Select appropriate sputter source
- Monitor interface sharpness
- Account for matrix effects
## Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- Nanomaterial Surface Functionalization Pipeline
## Input Schema
```json
{
"sample_id": "string",
"analysis_mode": "spectral|imaging|depth_profile",
"primary_ion": "Bi3+|Bi1+|C60+",
"polarity": "positive|negative",
"area_of_interest": {"x": "number", "y": "number"}
}
```
## Output Schema
```json
{
"identified_species": [{
"mass": "number (amu)",
"assignment": "string",
"intensity": "number"
}],
"chemical_maps": [{
"species": "string",
"image_path": "string"
}],
"pca_results": {
"principal_components": "number",
"variance_explained": ["number"]
}
}
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