ebl-process-controller

Electron Beam Lithography skill for high-resolution nanopatterning with dose optimization and proximity effect correction

509 stars

Best use case

ebl-process-controller is best used when you need a repeatable AI agent workflow instead of a one-off prompt.

Electron Beam Lithography skill for high-resolution nanopatterning with dose optimization and proximity effect correction

Teams using ebl-process-controller should expect a more consistent output, faster repeated execution, less prompt rewriting.

When to use this skill

  • You want a reusable workflow that can be run more than once with consistent structure.

When not to use this skill

  • You only need a quick one-off answer and do not need a reusable workflow.
  • You cannot install or maintain the underlying files, dependencies, or repository context.

Installation

Claude Code / Cursor / Codex

$curl -o ~/.claude/skills/ebl-process-controller/SKILL.md --create-dirs "https://raw.githubusercontent.com/a5c-ai/babysitter/main/library/specializations/domains/science/nanotechnology/skills/ebl-process-controller/SKILL.md"

Manual Installation

  1. Download SKILL.md from GitHub
  2. Place it in .claude/skills/ebl-process-controller/SKILL.md inside your project
  3. Restart your AI agent — it will auto-discover the skill

How ebl-process-controller Compares

Feature / Agentebl-process-controllerStandard Approach
Platform SupportNot specifiedLimited / Varies
Context Awareness High Baseline
Installation ComplexityUnknownN/A

Frequently Asked Questions

What does this skill do?

Electron Beam Lithography skill for high-resolution nanopatterning with dose optimization and proximity effect correction

Where can I find the source code?

You can find the source code on GitHub using the link provided at the top of the page.

SKILL.md Source

# EBL Process Controller

## Purpose

The EBL Process Controller skill provides comprehensive electron beam lithography process control, enabling high-resolution nanopatterning through dose optimization, proximity effect correction, and critical dimension control.

## Capabilities

- Pattern design and fracturing
- Dose optimization and modulation
- Proximity effect correction (PEC)
- Alignment and overlay control
- Resist processing optimization
- Critical dimension (CD) control

## Usage Guidelines

### EBL Process Control

1. **Pattern Preparation**
   - Design in CAD software
   - Fracture into write fields
   - Apply beam step size

2. **Dose Optimization**
   - Run dose matrices
   - Apply PEC algorithms
   - Account for pattern density

3. **Process Integration**
   - Optimize resist thickness
   - Control development conditions
   - Verify feature dimensions

## Process Integration

- Nanolithography Process Development
- Nanodevice Integration Process Flow

## Input Schema

```json
{
  "pattern_file": "string",
  "resist": "string",
  "thickness": "number (nm)",
  "target_cd": "number (nm)",
  "beam_voltage": "number (kV)",
  "beam_current": "number (pA)"
}
```

## Output Schema

```json
{
  "optimized_dose": "number (uC/cm2)",
  "pec_parameters": {
    "alpha": "number",
    "beta": "number",
    "eta": "number"
  },
  "write_time": "number (hours)",
  "expected_cd": "number (nm)",
  "cd_uniformity": "number (3sigma)"
}
```

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