nanoimprint-process-controller
Nanoimprint Lithography skill for high-throughput nanopatterning with template management and demolding optimization
Best use case
nanoimprint-process-controller is best used when you need a repeatable AI agent workflow instead of a one-off prompt.
Nanoimprint Lithography skill for high-throughput nanopatterning with template management and demolding optimization
Teams using nanoimprint-process-controller should expect a more consistent output, faster repeated execution, less prompt rewriting.
When to use this skill
- You want a reusable workflow that can be run more than once with consistent structure.
When not to use this skill
- You only need a quick one-off answer and do not need a reusable workflow.
- You cannot install or maintain the underlying files, dependencies, or repository context.
Installation
Claude Code / Cursor / Codex
Manual Installation
- Download SKILL.md from GitHub
- Place it in
.claude/skills/nanoimprint-process-controller/SKILL.mdinside your project - Restart your AI agent — it will auto-discover the skill
How nanoimprint-process-controller Compares
| Feature / Agent | nanoimprint-process-controller | Standard Approach |
|---|---|---|
| Platform Support | Not specified | Limited / Varies |
| Context Awareness | High | Baseline |
| Installation Complexity | Unknown | N/A |
Frequently Asked Questions
What does this skill do?
Nanoimprint Lithography skill for high-throughput nanopatterning with template management and demolding optimization
Where can I find the source code?
You can find the source code on GitHub using the link provided at the top of the page.
SKILL.md Source
# Nanoimprint Process Controller
## Purpose
The Nanoimprint Process Controller skill provides comprehensive nanoimprint lithography process control, enabling high-throughput nanopatterning through template design, imprint optimization, and defect management.
## Capabilities
- Template design and fabrication
- Imprint pressure and temperature optimization
- UV-NIL and thermal NIL protocols
- Demolding force analysis
- Residual layer control
- Defect inspection and yield analysis
## Usage Guidelines
### NIL Process Control
1. **Template Preparation**
- Design with demolding in mind
- Apply anti-sticking treatment
- Verify pattern fidelity
2. **Imprint Optimization**
- Optimize pressure and temperature
- Control residual layer thickness
- Minimize defects
3. **Yield Improvement**
- Track defect types
- Optimize demolding conditions
- Implement cleaning protocols
## Process Integration
- Nanolithography Process Development
- Directed Self-Assembly Process Development
## Input Schema
```json
{
"template_id": "string",
"resist_type": "thermal|uv_curable",
"target_features": {
"min_cd": "number (nm)",
"pitch": "number (nm)",
"aspect_ratio": "number"
},
"substrate": "string"
}
```
## Output Schema
```json
{
"process_parameters": {
"temperature": "number (C)",
"pressure": "number (bar)",
"time": "number (s)",
"uv_dose": "number (mJ/cm2)"
},
"residual_layer": "number (nm)",
"demolding_force": "number (N)",
"defect_density": "number (defects/cm2)",
"yield": "number (%)"
}
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